TTR-300
The Solar Cell Wafer Topology Measurement system is a complete system for thickness, resistivity and two-sided saw mark measurements.
Features and System specifications:
- Thickness measurement - 6 lines of thickness detection
- Resistivity measurement - 1 line of resistivity measurement along the center line of the wafer with a non-contact Eddy current type sensor.
- P/N determination - conductivity type (P or N) is measured in one point in the middle of the wafer with a non-contact SPV sensor.
- Saw mark - 6 lines of saw mark detection
- The data are transferred to the Data Collector PC
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