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WT-2000PV Multifunction Wafer Mapping Tool

The WT-2000PV is a tabletop measurement system, capable of performing a variety of measurements on PV cells, wafers, and blocks.  The base system includes the overhead functions, and you configure the measurement capabilities to match your specific needs, by selecting from the menu at the right. 

The WT-2000PV can measure blocks and ingots, as well as wafers and cells.  For measuring wafers and cells, people typically produce maps.  When measuring blocks or ingots, people often produce only line scans, to save time.  The same WT-2000PV can do both.


Measurement capabilities menu:
µ-PCD for measuring carrier lifetime
Eddy current for measuring bulk resistivity of wafers or blocks
SHR for measuring emitter sheet resistance

LBIC for measuring Light Beam Induced Current and external quantum efficiency
Reflectance for measuring specular and diffuse reflectivity at discrete wavelengths and Internal Quantum Efficiency

Most producers of PV cells own a WT-2000PV. It is extremely useful for:
Engineering development and characterization
Batch testing of production

Comprehensive troubleshooting of production problems