WT-2000P In-line Block Measurement Tool
Carrier recombination lifetime and resistivity are primary quality control parameters for multi-crystalline silicon blocks. The WT-2000P is a complete measurement tool utilizing the µ-PCD technique for monitoring minority carrier lifetime and the eddy current technique to monitor resistivity in silicon blocks in size up to 210x210x500mm. The system provides fast, non-contact measurements (single-point, line scan and/or maps). It has manual and automatic measurement modes and manual and automatic transport belt block loading capabilities.
| SYSTEM SPECIFICATIONS: |
| measurement technique: |
µ-PCD (lifetime);
eddy current (resistivity) |
| sample size: |
from 100x100x500mm to 210x210x500mm |
| loading: |
manual or automatic by transport belt |
| resolution in X-Y mapping: |
16,8,4,2,1 or 0.5mm |
| sample resistivity range: |
0.1 to 1000Ωcm |
| resistivity range: |
0.1 to 10Ωcm |
| lifetime range: |
0.1-1000µs |
| max number of data points: |
up to 400,000 |
| cycle time: |
1.5min including 5 linescans |
|
click on the photo to enlarge
|
