WT-2000MCT Narrow Bandgap Lifetime Tester
The WT-2000 MCT is a special design for µ-PCD lifetime measurement at different sample temperatures
| SYSTEM CONFIGURATION: |
| • |
whole wafer mapping at a preselected stabilized temperature
|
| • |
single-point lifetime scan as a function of temperature
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| SPECIFICATIONS: |
|
| Samples: |
HgCdTe, InSb, GaAs, etc. |
|
| Sample size: |
max. 100mm in diameter |
|
| Temperature range: |
from 80K to 325K |
|
| Cooling time: |
< 6 min from 325K to 80K |
|
| Temperature homogeneity: |
< 0.2K |
|
| Operating from one filling of LN2 (20l dewar): |
> 7.5 hours |
|
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APPLICATIONS
SINGLE-POINT LIFETIME MEASUREMENTS
MINORITY CARRIER LIFETIME AS A FUNCTION OF TEMPERATURE WITH THE CORRESPONDING MAPS
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