PV >Products >WT-1000 & WT-1000b
WT-1000 Lifetime Tester for Wafers

Low Cost, Non-Contact Single-Point Measurement in Silicon Wafers and Blocks


HIGHLIGHTS:
• No need for access to back side of the wafer
• Fully automatic operation and data evaluation
• Measurement selectable at any position on the wafer
• Measurement of mono- and multi-crystalline material
• Patented chemical surface passivation option available
• Wafers can be measured after each process step of solar cell manufacturing
  • Incoming as-cut wafer
  • Diffused wafers (with or without phosphorous glass)
  • Nitride coated wafers
  • Metallized wafers
  • Finished solar cells
• 1:1 correlation with the standard WT-2000 Wafer Tester

The WT-1000 is provided for fast, non-contact carrier lifetime measurement method that is capable of characterizing silicon material in each process step of solar cell manufacturing from as-cut wafer to the finished solar cell. WT-1000b is a model for block measurements

SPECIFICATIONS:
Materials: Si, Ge
Resistivity range: 0.1 to 1000Ωcm
Laser: 904nm wavelength
Measured spot diameter: 10mm2
Microwave source: variable frequency around 10.3GHz
Lifetime range: 100ns to 20ms
Lifetime resolution: 0.1%
Measurement time: 0.5s/data point
Measurement technique: µ-PCD
Single shot or continuous measurement

Additional configurations available if needed