Semilab offers a unique non-contact method of measuring the type of a semiconductor. This conductive type measurement technology is available in Semilab’s handle-held, battery operated PN-100 and also in other systems.
The RT-100 measures thickness and type of large chunks of silicon. The RT-110 measures thickness, resistivity and type of wafers, and the WLT and WMT measure thickness, resistivity, and type in In-Line systems.
