Measuring the emitter sheet resistance of solar cells is important. Semilab offers a innovative, non-contact method of making this measurement. This technology is called SHR.
The SHR-1000 makes single point measurements of the sheet resistance of a diffused layer. The WT-2000PV makes maps of the same parameter. Semilab’s CLS and CMS In-Line systems make line scans of sheet resistance of PV wafers on conveyor belts.
