The RT-110 is a non-contact bulk resistivity measurement tool for rapid classification of silicon wafers, ingots and feedstock material. It operates via eddy current technology.
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Resistivity range 0.01-20 Ωcm
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Measurement time ~ 3s
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Computer controlled operation
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No sample preparation
Options:
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Wafer Thickness Measurement in the range of 200 to 1000 µm
