The Resistivity Tester is a non-contact bulk resistivity measurement tool for rapid classification of silicon wafers. It operates via eddy current technology.
Features:
•
Resistivity range 0.01-20 Ωcm
•
Measurement time ~ 3s
•
Computer controlled operation
•
No sample preparation
Options:
•
Wafer Thickness Measurement in the range of 200 to 1000 µm
