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Microwave-PCD

A semiconductor material, in the dark, at a fixed temperature, has a concentration of holes and electrons determined by the doping level.  The product of the concentration of donors and the concentration of acceptors is a constant, ni2, for a given type of semiconductor, at a given temperature.  For silicon ni equals 1E10.



Light hitting a semiconductor material creates electron-hole pairs, i.e. additional carriers, which disturb the equilibrium.  The additional carriers increase the conductivity of the semiconductor.  When the light shuts off, the excess recombine to return to equilibrium.  The instantaneous rate of recombination is greater when the excess carrier concentration is greater, and thus the recombination process is one of exponential decay.  In other words, if one were to plot the conductivity as a function of time, the resultant curve would be an exponential decay.  The time constant of this curve is, by definition, the carrier lifetime.  The process is called Photo Conductive Decay (PCD).

 

It turns out that the reflection of a microwave signal striking a semiconductor is dependent on the conductvity of the semiconductor.  Thus, if one measures the microwave reflection as a function of time, the result is also an exponential decay.  (The curve may also be flipped about the horizontal axis, depending on the microwave circuit.)  Measuring carrier lifetime by this method is called microwave-PCD, commonly abbreviated as µ-PCD.

A more complete discussion of the theory is available in Technical Note #200.

Several Semilab products offer µ-PCD measurement capability for PV applications.  The WT-2000PV offers maps of lifetime on wafers and cells.  The WT-2000P and WT-2000D offer maps and line scans of lifetime on blocks of silicon.  The WLL and WML In-Line systems create line scans of lifetime on wafers (or cells) on a conveyor belt.