Semilab Literature

Semilab is continually working to ensure that we keep our customers up to date with the latest information regarding metrology. The following are some of the published reports currently available.
Technical Notes (pdf format)
  • TN200
    Theory of µ-PCD for Measuring Lifetime
  • TN 201
    Theory of SPV for Measuring Diffusion Length
  • TN202
    Comparison of µ-PCD and SPV
Published Materials

Click here for a list of publications involving Semilab Products and Technologies.