Diffusion length is a property of a bulk semiconductor material, telling how long an excess carrier travels, on average, before recombining to achieve equilibrium. Diffusion length of a semiconductor with a perfect crystal lattice and no comtamination will be long, and any imperfections in the semiconductor material or contamination will reduce the diffusion length. Thus, monitoring diffusion length is an excellent method to detect contamination.
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For PV applications, Semilab offers a technique based on LBIC measurement to measure diffusion length.
The WT-2000PV offers maps of diffusion length measurements for PV solar cells, with metalization, via a benchtop system.
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