CV involves forming a capacitor by creating a conductive electrode on top of the oxide to be measured. The electrode and the silicon wafer form the two capacitor plates, and the oxide forms the insulator. One varies the DC voltage between the capacitor plates and measures the capacitance using a high frequency signal. While the basic technique is very powerful, forming the electrode is expensive, time-consuming, and often the cause of false alarms.
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In the past 20 years two alternative technologies have been invented: Surface Charge Analysis and Kelvin probe / corona charging, which Semilab shortens to VQ. Both techniques eliminate the requirement to create electrodes on top of the oxide being measured.
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