Often, it is necessary to monitor the bulk resistivity of a semiconductor sample. Semilab uses an eddy current measurment technique to make such measurements.
The RT-100 is used to monitor bulk resistivity of large pieces of silicon, such as ingots, feedstock material, bricks, and chunks. The RT-110 uses similar technology to make single point measurements of wafers. Both of these products are popular among wafer reclaim and silicon reclaim customers, as well as wafer makers and block makers.
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The WT-2000PV makes maps of resistivity of PV wafers. The WT-2000P and WT-2000D make line scans (and maps) of blocks of silicon, and resistivity measurements are available as an option. For In-Line measurements of PV wafers on a conveyor belt, the WLT and WMT systems make resistivity and thickness measurements.
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